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Currently, it's not possible to run infix tests from an external project (based on infix) due to an incompatibility between the configuration used in the tests (the default configuration within the image generated by the external project) and the infix base configuration expected by the test cases. Therefore, a simple configuration specifically for testing purposes needs to be generated within an image. This test-config should always be generated but only loaded when the device is in test mode. Part of issue #568
2 lines
89 B
Plaintext
2 lines
89 B
Plaintext
Templates for generating device-specific factory-config, failure-config and test-config.
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